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Teseq Schaffner NSG 3040-IEC-PLUS
Teseq Schaffner NSG 3040-IEC-PLUS
Teseq’s new NSG 3040 is an easy-to-use multifunction generator that simulates electromagnetic
interference effects for immunity testing in conformity with international, national and manufacturers’
standards including the latest IEC/EN standards. The NSG 3040 system is designed to fulfi ll conducted
EMC test requirements for CE mark testing, which generally include combination wave surge, Electrical
Fast Transient (EFT) pulses and Power Quality Testing (PQT). Extensive expansion capabilities enable the
system to be confi gured for a much broader range of applications.
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Description
Teseq Schaffner NSG 3040-IEC-PLUS
Teseq’s new NSG 3040 is an easy-to-use multifunction generator that simulates electromagnetic
interference effects for immunity testing in conformity with international, national and manufacturers’
standards including the latest IEC/EN standards. The NSG 3040 system is designed to fulfi ll conducted
EMC test requirements for CE mark testing, which generally include combination wave surge, Electrical
Fast Transient (EFT) pulses and Power Quality Testing (PQT). Extensive expansion capabilities enable the
system to be confi gured for a much broader range of applications.
Featuring an innovative, modular design, the NSG 3040 is a versatile system that can be confi gured
for basic testing needs and expanded to meet the needs of sophisticated test laboratories. Teseq’s well
proven “Master-Slave” architecture enables individual pulse modules to be calibrated separately, with
calibration data and correction factors stored on the slave controller. New modules can be easily installed
with no need to return the entire system for calibration.
