Keysight-Agilent E5052A

Keysight E5052A Signal Source Analyzer

The Keysight E5052A Signal Source Analyzer (SSA) is a new class of instrument that can evaluate the critical performance characteristics of nearly all types of RF and microwave signal sources. Agilent’s goal in creating the SSA was to offer a single instrument that would significantly speed measurement times, and help R&D and manufacturing engineers in the wireless communications, broadband optical, aerospace/defense and electronics industries perform tests more accurately, and with unprecedented simplicity. The SSA also significantly lowers cost by eliminating the need to purchase multiple standalone instruments.


The SSA has been designed to meet or exceed current and anticipated requirements for each measurement type. Frequency, power and DC current tests are facilitated by simultaneously measuring frequency, RF power and DC current consumption. DC tuning (control) voltage and DC power sweeps enable a variety of measurements, including:

Tuning sensitivity (frequency versus DC tuning voltage)
Frequency pushing (frequency versus DC power voltage)
RF power versus either DC tuning voltage or DC power voltage
DC current consumption versus either DC tuning voltage or DC power voltage
Two internal DC sources for device-under-test (DUT) power and control voltages are optimized for use with signal sources, which are very sensitive to noise on either tuning voltage or power voltage lines. Either DC control or power voltage can be swept with the result displayed on the instrument’s LCD. There is no need to control the voltages with an external PC. For versatile transient measurements that are necessary for characterizing PLL synthesizers and transmitters, the SSA employs frequency and phase demodulation as well as power measurements. Frequency, phase and power transients are simultaneously measured in heterodyne (narrowband) mode and direct (wideband) mode. Wideband mode is also available for wide frequency transient to enable designers to see more overall transient phenomenon. An external hardware trigger is accommodated by a rear-panel interface, and video and pre-trigger events can be observed before and after an event. Fine resolution is maintained even at the instrument’s highest sample rate of 10 ns. The instrument’s spectrum monitor function facilitates measurement of reference signal leakage (spurious) around the carrier and is useful because the signal source does not need to be reconnected.


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